SKD936H Turret Test Handler
SKD936H High Temperature Turret Test Handler is applicable for discrete devices, IC devices and other products with high-temperature testing needs, adding high-temperature testing capability on the basis of the original room-temperature performance to ensure stable performance. It is suitable for normal and high temperature test sorting and classification of PDFN /DFN / MSOP / SOT / SOP / SOD / TO / SMA/B/C and other components.
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Semiconductor Field
Test Sorting Equipment
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Product Description
SKD936H High Temperature Turret Test Handler is applicable for discrete devices, IC devices and other products with high-temperature testing needs, adding high-temperature testing capability on the basis of the original room-temperature performance to ensure stable performance. It is suitable for normal and high temperature test sorting and classification of PDFN /DFN / MSOP / SOT / SOP / SOD / TO / SMA/B/C and other components.
●Test components: 1-4 stations of high temperature (optional) + room temperature, heating temperature ≤ 180 ° (high temperature test comes with insulation design)
●Temperature control accuracy: heating temperature ≤ 180 °, temperature control accuracy of ± 3 ° C, PDFN5 * 6 as an example can be pr+eheated at the same time 96 pieces of material
●Pickhead feature shielding and automatic height correction functions.
●Automatic feeding (bowl in) : Bowl in, loading speed is fast and stable;
Main turret: The main turret is equipped with 36 pickheads driven by DDR motor, which can accurately send the product to the center of each station through the adsorption of the pickhead
●Orientation Aligner: accurate positioning and commutation of the product, positioning tolerance ≤ 0.005mm, directional accuracy up to 0.1 degrees
●Marking : the marking station can complete laser marking, vacuuming, marking vision inspection and other functions, greatly speeding up the marking speed;
●Tape out: In addition to automatic taping, it also has an automatic replacement function and sealing vision inspection.
●Vision inspection function after sealing(optional).
Important parts
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Sub-turret heating device, tested on a heating plate, with high accuracy of temperature control, with color poka-yoka. | Flip components to adjust device orientation. High speed and simple structure | Cooling sub-tray adopts vortex tube for a quicker cooling |
Table parameters
SKD936H Turret Test Handler | ||
Suitable Components | PDFN, DFN, MSOP, SOT, SOP , SOD , TO , SMA/B/C, etc | |
UPH | Take DFN5*6 as an example, UPH≥10K(test time less than 200MS) | |
High Temperature Test Station | 1-4 stations available | |
Contact Type | Pop-up type | |
Categorization | 4+4+1 | |
Onload | Bowl in/ Tube in | |
Offload | Tape out/Tube out | |
Stability | MTBA>60min MTTA<3min MTBF>168H | |
High Temperature Test Temperature | 30~180℃±3℃ | |
Atmospheric Pressure | 0.4-0.7MPa | |
Vacuum | 65Kpa | |
Power Source | AC220V /380V 50/60Hz | |
Marking parameters | 10W laser marking equipment /20W pulse marking equipment(optional); Marking range :110mmX110mm\70mmX70mm; Wire carving speed :-7000mm/s, Minimum character :0.5y0.3; Qutput power:0-10Wt /20W optional | |
Lmage Parameter | Camera and resolution: 1.6-megapixel CCD camera, resolution H1440xV1080 pixels; accuracy: ≤0.015mm/pixel; cycle time: <50ms | |
Bus Program | High precision, fast speed, open all servo parameter Settings, convenient equipment debugging and monitoring; MTBA original data records, equipment operation logs, equipment fault alam codes and informationand other data are permanently stored | |
Pickheads | 36 | |
Important components | Imported DDR |
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