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SKD810 H equipment is a fully automatic sorting equipment specially designed for testing TO series packaged power device products. The sorting equipment has multiple test stations in series at normal temperature / high temperature, integrating the functions of high-temperature heating of products, high-temperature testing ( or normal temperature testing ) , laser marking, brush dust removal, and 2D visual inspection .

SKD920 Cam-type Dual track Test Handler meets high-output demands for products like SMA/B/BF, MBF/S diodes, offering 40-60% faster speed compared to DDR turret test handler under the same testing time. Integrated marking and vision systems provide customers with cost-effective production equipment.

SKD308TB TRI - temperature Pick&Place Test Handler is applicable for multi-functional testing and sorting needs to meet customers' diverse testing needs. It is suitable for low/ normal/high-temperature testing, sorting, and classification of MSOP/QFN/LGA/BGA/CSP (3X3-10X10 mm) , and integrates imaging systems to yield high-quality product output to customers.

The SKD308T tri-temperature pick and place test handler is suitable for DFN, QFN, LQFP, LGA, BGA, CSP, SOP, MSOP and other product specifications in 3X3-110X110 low temperature/normal temperature/high temperature test and classification requirements. To bring high quality product output to customers.

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